John A Woollam

1967, Ph.D., Solid State Physics, Michigan State University. 1978, M.S., Electrical Engineering, Case Western Reserve University. 1963, M.S., Physics, Michigan State University. 1961, B.A., Liberal Arts, Kenyon College A member of the UNL faculty since 1979, Woollam was recognized for sustained contribution of spectroscopic ellipsometry, including greatly improved instrumentation and numerous new applications. In 1987, he founded the J.A. Woollam Co. Inc., now a worldwide leader in ellipsometry, a process that use reflected polarized light to detect properties of materials and make precise measurements of films that are only an atom or two thick.